Overview
45 nm
65 nm
90 nm
0.13 ¦Ìm
0.15 ¦Ìm
0.18 ¦Ìm
0.25 ¦Ìm
0.35 ¦Ìm
Mixed Signal/RF CMOS
High-Voltage Technology
Micro-Display Technology
Non-Volatile Memory










Non-Volatile Memory
 
EEPROM

Front-end technology

  0.18¦Ìm
1.8V/16V
Cell size of 2.88¦Ìm2, FLOTOX type cell
Endurance of > 500K program/erase cycles
Triple well
STI isolation
Co-salicide process
data retention capability that has passed 3 lots 150¡ãC and 1000 hours at the IP level
Added on Analog Devices:
  Vractor (Junction/Oxide)
  Various Cap: MIM, PiP, Stacked Cap (MiM/PiP/Oxide)
  Native Vt Device
  High resistance poly (HRP) (1000 ohm/¡õ)
  Schottky Diode
2 Options for Various Applications:
  EE+ROM (NOR-Type) for low cost and high performance applications
  EE+OTP for low cost and flexible ROM applications. (OTP as ROM replacement)

  0.35¦Ìm
3.3/16V
Twin well
LOCOS isolation
Titanium-salicide process
3.3/16V and 5V/16V options
HVNMOS, HVPMOS and native HVNMOS device options
PiP and MiM capacitors for mixed-signal application
Cell size of < 10¦Ìm2, FLOTOX type cell
Endurance of >1 million program/erase cycles

Device options of HVNMOS, HVPMOS, and native HVNMOS are also available. In addition, this technology features PiP and MiM capacitors for mixed-signal applications.

Available in various memory capacities, from 256b to 64kB, SMIC's 0.18¦Ìm and 0.35¦Ìm EEPROM technology presents flexible solutions for smart card or SIM card, embedded SOC applications, and other applications.

Extensive IP for this technology is available. Please refer to the Design Services section or contact us at Design_Services@smics.com.

SMIC has been qualified by a major IDM customer for smart card manufacturability. In addition, our mask shop has been certified for Chinese ID card manufacturing.

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